G07000 - SEMI G70 - プラスチックパッケージリードフレーム測定用装置とリードフレーム支持具のスタンダード Revision:SEMI G70-0996 (Reapproved 0811) - Inactive The test method in this

The test method in this Standard uses APL test patterns with the APL specified for both the region under test and the background region to determine the APL contrast ratio

Category 6d – Notched 150 mm diameter

1-0703 (first published)

This Guide is applicable to any type of equipment for processing semiconductor units

wafer fabs

G07000 - SEMI G70 - プラスチックパッケージリードフレーム測定用装置とリードフレーム支持具のスタンダード Revision:SEMI G70-0996 (Reapproved 0811) - Inactive The test method in thisglobal Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org1996200411 : Z Referenced SEMI Standards SEMI G57 Guideline for Standardization of Leadframe Terminology