Pay in 4 interest-free payments of $48.25 Learn more
Ships within 48 hours · Estimated delivery Jul 26 - Jul 31
SEMI MF42 — Test Methods for Conductivity Type of Extrinsic Semiconductor Materials
This Specification defines the materials and dimensions for the metallic leadframe (stamped or etched) used in the construction of CerDIP Package
SEMI PV99-0321
9-0701 (technical revision)
originally published in 1984
M03200 - SEMI M32 - Guide to Statistical Specifications StdTier-Tier1 SEMI MF42 — Test MethodsThis standard was technically approved by the global Silicon Wafer Committee. This edition was approved for publication by the global Audits & Reviews Subcommittee on November 21, 2006. It was available at www. semi. org in February 2007. Originally published September 1998; previously published July 2004. Specifications are based on requirements negotiated between trading partners. This document describes an explicit specification form that defines
US$ 125.00
US$ 147.00
US$ 100.00
US$ 125.00
US$ 125.00
US$ 175.00
US$ 779.05