G02900 - SEMI G29 - Test Method for Trace Contaminants in Molding Compounds Revision:SEMI G29-0519 - Inactive With increased levels of integration

With increased levels of integration

It defines the view of the equipment through the equipment communications interface

NOTICE: This Document was balloted and approved for withdrawal in 2011

near the top surface region of the wafer

For this purpose

G02900 - SEMI G29 - Test Method for Trace Contaminants in Molding Compounds Revision:SEMI G29-0519 - Inactive With increased levels of integrationThis Specification defines the test method for determination of extractable trace contaminants in molding compound. This Test Method is suitable for all molding compound materials and may be used by supplier and customers to determine the trace contaminants in molding compound. Referenced SEMI Standards None.