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This Specification defines what form a data collection plan takes
together with test methods suitable for determining their magnitude
This Standard will also insure interchangeability at all mechanical interfaces within process tools as well as with transportation and automation cassettes
Critical Pitting Temperature Test for Stainless Steel
The purpose of this Standard is to support RMS in the following aspects:
M08700 - SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors Revision:SEMI M87-0116 - Superseded This Specification defines what formThe purpose of this Test Method is to specify methods for the contactless measurement of the resistivity of semi insulating samples and wafers. This Test Method covers the determination of the electrical resistivity of semi insulating semiconductors, including GaAs, InP, CdTe, Cd(Zn)Te, SiC, GaN, and AlN, within the resistivity range 1E5 to 1E12 cm. It may also be used to characterize other materials exhibiting resistivity in this range, including in